Intellectual Property India Publishes Patent Application for Geometry-Aware Wafer Defect Classification System With Incremental Model Adaptation And Method Of Operation

MUMBAI, India, June 30 -- Intellectual Property India has published a patent application (202641076286 A) filed by Vellore Institute Of Technology on June 19, 2026, for Geometry-Aware Wafer Defect Classification System With Incremental Model Adaptation And Method Of Operation.

Inventors include Aju D; Jay Krishna Kamlekar; Manas Maahir. R; and Poojana Boina Kartheek Yadav.

The application for the patent was published on June 26, 2026, under issue no. 26/2026.

Abstract: The present disclosure proposes a geometry-aware wafer defect classification system (100) that processes wafer map data using polar-coordinate representation, convolutional neural network-based feature extraction, transformer-based global feature learning, and incremental ...