MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202621060913 A) filed by Pimpri Chinchwad College Of Engineering, Pune; Pallavi Tushar Nikumbh; Dr. Anuradha Thakare; Om Deshmukh; Piyush Daspute; and Payal Lokhande on May 13, 2026, for Distributed Defect Detection System And Method For Industrial Manufacturing Units.
Inventors include Pallavi Tushar Nikumbh; Dr. Anuradha Thakare; Om Deshmukh; Piyush Daspute; and Payal Lokhande.
The application for the patent was published on July 10, 2026, under issue no. 28/2026.
Abstract: ABSTRACT DISTRIBUTED DEFECT DETECTION SYSTEM AND METHOD FOR INDUSTRIAL MANUFACTURING UNITS The present disclosure relates to a distributed defect detection system and method fo...