MUMBAI, India, Oct. 5 -- Intellectual Property India has published a patent application (202541028954 A) filed by Nokia Technologies Oy on March 27, 2025, for Conformance Testing Of Ai/Ml Beam Management: Pre-Alignment And Generation Of Set A/B Beams.
Inventors include Mahendra, Rachit; and Syed Muhammad, Fahad.
The application for the patent was published on October 02, 2026, under issue no. 40/2026.
Abstract: For a TE for testing a DUT for conformance testing of a ML-based BM use case, receiving an indication that the DUT supports conformance testing of ML-based BM with at least a combination of test probes. The TE adjusts a configuration for the DUT and pre-test alignment information for the conformance testing. The TE sends an indica...