Intellectual Property India Publishes Patent Application for Automated Diagnostic Station And Method For Post-Analytical Assessment Of Chromatographic Column Integrity Using Decay Vector Analysis And Nmr Spectroscopy.

MUMBAI, India, Oct. 12 -- Intellectual Property India has published a patent application (202641031744 A) filed by B Pratyusha on March 16, 2026, for Automated Diagnostic Station And Method For Post-Analytical Assessment Of Chromatographic Column Integrity Using Decay Vector Analysis And Nmr Spectroscopy..

Inventor includes B Venkata Kiran.

The application for the patent was published on October 09, 2026, under issue no. 41/2026.

Abstract: Abstract This invention relates to an automated diagnostic station and method for non-destructively assessing the structural integrity and packing uniformity of chromatographic columns. The apparatus utilizes low-field Time-Domain Nuclear Magnetic Resonance (TD-NMR) spectroscopy, employing a cylindrica...