Intellectual Property India Publishes Patent Application for An Artificial Intelligence-Based System And Method For Automated Detection And Classification Of Manufacturing Defects

MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641114207 A) filed by Aditya Institute Of Technology And Management; K. Ananda Kumar; K. Sai Shri; P. Sai Tharun; Meesala Sudhir Kumar; Kurman Sangeeta; N. Rajani; and Pedada Priyanka on September 23, 2026, for An Artificial Intelligence-Based System And Method For Automated Detection And Classification Of Manufacturing Defects.

Inventors include K. Ananda Kumar; K. Sai Shri; P. Sai Tharun; Meesala Sudhir Kumar; Kurman Sangeeta; N. Rajani; and Pedada Priyanka.

The application for the patent was published on September 25, 2026, under issue no. 39/2026.

Abstract: The present disclosure relates to an artificial intelligence-based system (100) for d...