Intellectual Property India Publishes Patent Application for Ai Based Automated Defect Detection By Ultrasound Non Destructive Method.

MUMBAI, India, July 30 -- Intellectual Property India has published a patent application (202641088412 A) filed by J. J. College Of Engineering And Technology on July 20, 2026, for Ai Based Automated Defect Detection By Ultrasound Non Destructive Method..

Inventors include Dr. T. Mohandas; Dr. P. Mathiyalagan; Dr. M. Meena; Dr. R. Kaliammal; Mr. K. Vinoth; Dr. G. Parvathy; and Mr. A. Iruthayaseelan.

The application for the patent was published on July 24, 2026, under issue no. 30/2026.

Abstract: An ultrasonic inspection system integrated with Artificial Intelligence for automated non-destructive testing is disclosed. The system comprises an ultrasonic pulse generator, a piezoelectric transducer, a signal conditioning unit, an Artificial ...