Intellectual Property India Publishes Patent Application for A Neural Network-Based Intelligent Pcb Inspection System Using Automated Image Analysis And Defect Recognition

MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641112096 A) filed by Vallurupalli Nageswara Rao Vignana Jyothi Institute Of Engineering And Technology on September 18, 2026, for A Neural Network-Based Intelligent Pcb Inspection System Using Automated Image Analysis And Defect Recognition.

Inventor includes Mrs. Y. Prasanthi.

The application for the patent was published on September 25, 2026, under issue no. 39/2026.

Abstract: ABSTRACT [0034] Printed circuit board defect detection constitutes a critical quality control step in electronics manufacturing to ensure functional reliability and reduce production failures. This work presents a comparative evaluation of two hybrid deep learning pipel...