Intellectual Property India Publishes Patent Application for A Comprehensive Examination On Embedded Deterministic Test And Its Effect On Test Data And Fault Classification

MUMBAI, India, Aug. 10 -- Intellectual Property India has published a patent application (202541006510 A) filed by Hindusthan Institute Of Technology on January 27, 2025, for A Comprehensive Examination On Embedded Deterministic Test And Its Effect On Test Data And Fault Classification.

Inventors include Dr. C. Natarajan; Dr. K. Kalpana; Dr. B. Paulchamy; B. Hakkem; A. Roopasree; and Janarthanan S.

The application for the patent was published on July 31, 2026, under issue no. 31/2026.

Abstract: A COMPREHENSIVE EXAMINATION ON EMBEDDED DETERMINISTIC TEST AND ITS EFFECT ON TEST DATA AND FAULT CLASSIFICATION Test compression was developed to help address this problem. When an ATPG tool ·generates a test for a fault, or a set of faults, only ...