Intellectual Property India Publishes Patent Application for 'Probe System For Non-Destructive Electrical Characterization Of A Device Under Test' Filed by Srm University

MUMBAI, India, May 1 -- Intellectual Property India has published a patent application (202641050285 A) filed by Srm University, Amaravati, Andhra Pradesh, on April 20, for 'probe system for non-destructive electrical characterization of a device under test.'

Inventor(s) include Kaliyaperumal, Ramkumar; Govindarajan, Sneigitha; Iyyamperumal, Mukesh; and Mukhopadhyay, Sabyasachi.

The application for the patent was published on May 1, under issue no. 18/2026.

According to the abstract released by the Intellectual Property India: "A probe system (100) for non-destructive electrical characterization of a device under test. The system (100) includes a distributed micro-fiber brush (102) configured to establish electrical contact with a surfac...