Intellectual Property India Publishes Patent Application for 'Hybrid Opto-Acoustic System For Concurrent Volumetric Defect Detection And Surface Metrology' Filed by Adhithyan V J; Akshay Ajith; Aibel Geevarghese Saju; Alen Abraham; and Er. Varun Mathew Idiculla

MUMBAI, India, Feb. 27 -- Intellectual Property India has published a patent application (202641017336 A) filed by Adhithyan V J; Akshay Ajith; Aibel Geevarghese Saju; Alen Abraham; and Er. Varun Mathew Idiculla, Kottayam, Kerala, on Feb. 17, for 'hybrid opto-acoustic system for concurrent volumetric defect detection and surface metrology.'

Inventor(s) include Adhithyan V J; Akshay Ajith; Aibel Geevarghese Saju; Alen Abraham; and Er. Varun Mathew Idiculla.

The application for the patent was published on Feb. 27, under issue no. 09/2026.

According to the abstract released by the Intellectual Property India: "This invention discloses a hybrid non-destructive testing (NDT) and metrology architecture integrating a laser-based excitation sour...