MUMBAI, India, Feb. 13 -- Intellectual Property India has published a patent application (202611001995 A) filed by Lovely Professional University, Phagwara, Punjab, on Jan. 8, for 'digital field inspection and traceability platform.'
Inventor(s) include Dipanjali Gupta; Saad Alam; Shubham Lamba; Alapan Dey; and Suhel Mehandi.
The application for the patent was published on Feb. 13, under issue no. 07/2026.
According to the abstract released by the Intellectual Property India: "The present invention discloses a Digital Field Inspection and Traceability Platform (100) designed to digitize field inspections and provide end-to-end traceability of lots or assets. The system (100) comprises a Field Client (102) for offline-first tamper-evident...