Intellectual Property India Publishes Patent Application for 'Contour Shape Measurement Device And Method For The Same' Filed by Kobelco Research Institute, Inc.

MUMBAI, India, April 10 -- Intellectual Property India has published a patent application (202544094064 A) filed by Kobelco Research Institute, Inc., Hyogo, Japan, on Sept. 30, 2025, for 'contour shape measurement device and method for the same.'

Inventor(s) include Nishiyama Kohei; and Furuta Yohei.

The application for the patent was published on April 10, under issue no. 15/2026.

According to the abstract released by the Intellectual Property India: "The present invention is a contour shape measurement device that measures a contour shape of a peripheral edge of a measurement target on a basis of a shadow image obtained by imaging a shadow of the peripheral edge generated by projecting parallel light from a tangential direction of an o...