Intellectual Property India Publishes Patent Application for 'AI-Driven System And Method For Real-Time Defect Detection In Aluminium Profile Quality Inspection' Filed by Parul University; Dr. Jaydeep R. Tadhani; Jaydevsinh B. Vala; Dr. Vipul Vekariya; and Dr. Sunil J. Soni

MUMBAI, India, Feb. 13 -- Intellectual Property India has published a patent application (202521054196 A) filed by Parul University; Dr. Jaydeep R. Tadhani; Jaydevsinh B. Vala; Dr. Vipul Vekariya; and Dr. Sunil J. Soni, Vadodara, Gujarat, on June 4, 2025, for 'ai-driven system and method for real-time defect detection in aluminium profile quality inspection.'

Inventor(s) include Dr. Jaydeep R. Tadhani; Jaydevsinh B. Vala; Dr. Vipul Vekariya; and Dr. Sunil J. Soni.

The application for the patent was published on Feb. 13, under issue no. 07/2026.

According to the abstract released by the Intellectual Property India: "The invention pertains to an AI-driven system and method for real-time defect detection in aluminum profile quality inspecti...