MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202641063787 A) filed by Aneesh Sai Basavaraju, Hyderabad, Telangana, on May 20, for 'ai-based probabilistic exam pattern analysis and personalizedstudy optimization system.'
Inventor(s) include Aneesh Sai Basavaraju.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "Exemplary embodiments of the present disclosure are directed toward AI-Based probabilistic exam pattern analysis and personalized study optimization system. It includes a historical examination data collection module that acquires past papers across multiple years. A question tagging mo...