Intellectual Property India Publishes Patent Application for “multispectral Structural Analysis For Enhanced Object Inspection Using Uwb”

MUMBAI, India, June 19 -- Intellectual Property India has published a patent application (202441094963 A) filed by Samsung Electronics Co. , Ltd on December 03, 2024, for “multispectral Structural Analysis For Enhanced Object Inspection Using Uwb”.

Inventors include Siddharth Gupta; Dewanshu Haswani; and Vijay Narayan Tiwari.

The application for the patent was published on June 05, 2026, under issue no. 23/2026.

Abstract: ABSTRACT “MULTISPECTRAL STRUCTURAL ANALYSIS FOR ENHANCED OBJECT INSPECTION USING UWB” Embodiments disclosed herein relates to a method and electronic device for determining a level of quality of an object. The method includes receiving, by an electronic device (101), reference signals from each layer of plurality of lay...