ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,707, issued on April 14, was assigned to SUZHOU INDUSTRIAL PARK FUTES AUTOMOTIVE ELECTRONICS Co. LTD (Suzhou, China). "Symmetric structura... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,708, issued on April 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Biosensor devices and methods of ... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,709, issued on April 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Semiconductor device with sensor ... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,710, issued on April 14, was assigned to GlobalFoundries U.S. Inc. (Malta, N.Y.). "Ion-sensitive field-effect transistors with local-field... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,711, issued on April 14, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automated analysis apparatus" was invented by Masafumi Miyake (... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,712, issued on April 14, was assigned to SENSOCURE AS (Skoppum, Norway). "Sensor" was invented by Stein Ivar Hansen (Skoppum, Norway). Ac... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,713, issued on April 14, was assigned to LG ENERGY SOLUTION LTD. (Seoul, South Korea). "Wire bonding defect detection apparatus and operat... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,714, issued on April 14, was assigned to SOUTH CHINA UNIVERSITY OF TECHNOLOGY (Guangzhou City, China) and TONGJI UNIVERSITY (Shanghai City,... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,715, issued on April 14, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan) and NATIONAL UNIVERSITY CORPORATION NAGAOKA UNIVERSITY OF TECH... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,717, issued on April 14, was assigned to SUPPLYZ Holding B.V. (The Hague, Netherlands). "System and method for analyzing a material" was i... Read More