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US Patent Issued to MITUTOYO on June 30 for "Measuring device and measuring method" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,319, issued on June 30, was assigned to MITUTOYO Corp. (Kawasaki, Japan). "Measuring device and measuring method" was invented by Shunsuke ... Read More


US Patent Issued to Allegro MicroSystems on June 30 for "Redundant inductive sensor system and methods" (French Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,320, issued on June 30, was assigned to Allegro MicroSystems LLC (Manchester, N.H.). "Redundant inductive sensor system and methods" was in... Read More


US Patent Issued to Tokyo Electron on June 30 for "Device and method for determining wafer bow" (New York, Texas, Florida Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,321, issued on June 30, was assigned to Tokyo Electron Ltd. (Tokyo). "Device and method for determining wafer bow" was invented by Daniel F... Read More


US Patent Issued on June 30 for "Method for testing an OCT device and test object" (German Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,322, issued on June 30. "Method for testing an OCT device and test object" was invented by Eva Lankenau (Langstedt, Germany). According to... Read More


US Patent Issued to LG Chem on June 30 for "Coating thickness measuring device and coating device including the same" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,323, issued on June 30, was assigned to LG Chem Ltd. (Seoul, South Korea). "Coating thickness measuring device and coating device including... Read More


US Patent Issued to Tata Consultancy Services on June 30 for "Non-destructive estimation of coating layer thickness based on sweep frequency photo acoustic guided wave technique" (Indian Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,324, issued on June 30, was assigned to Tata Consultancy Services Ltd. (Mumbai, India). "Non-destructive estimation of coating layer thickn... Read More


US Patent Issued to SHANDONG UNIVERSITY, SHANDONG RESEARCH AND DESIGN INSTITUTE OF INDUSTRIAL CERAMICS on June 30 for "On-line measurement-error correction device and method for inner profile of special-shaped shell" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,325, issued on June 30, was assigned to SHANDONG UNIVERSITY (Jinan, China) and SHANDONG RESEARCH AND DESIGN INSTITUTE OF INDUSTRIAL CERAMICS... Read More


US Patent Issued to NIPPON STEEL on June 30 for "Thread shape dimension measuring device and thread shape dimension measuring method" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,326, issued on June 30, was assigned to NIPPON STEEL Corp. (Tokyo). "Thread shape dimension measuring device and thread shape dimension mea... Read More


US Patent Issued to KLA on June 30 for "System and method for suppression of tool induced shift in scanning overlay metrology" (Israeli, American Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,327, issued on June 30, was assigned to KLA Corp. (Milpitas, Calif.). "System and method for suppression of tool induced shift in scanning ... Read More


US Patent Issued to CHANGZHOU HUADA KEJIE OPTO-ELECTRO INSTRUMENT on June 30 for "Construction surface flatness detector" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,328, issued on June 30, was assigned to CHANGZHOU HUADA KEJIE OPTO-ELECTRO INSTRUMENT Co. LTD (Changzhou City, China). "Construction surfac... Read More