US Patent Issued to MITUTOYO on June 30 for "Measuring device and measuring method" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,319, issued on June 30, was assigned to MITUTOYO Corp. (Kawasaki, Japan).

"Measuring device and measuring method" was invented by Shunsuke Tanaka (Kanagawa, Japan) and Hirokazu Kobayashi (Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring device includes a rotary encoder having a rotary scale and a plurality of detection portions, and a control device. The rotary scale are arranged around a rotation axis and has a scale pattern in which a plurality of patterns are arranged along a circumferential direction. The plurality of detection portions are arranged around the rotation axis, and reads the plurality of patterns from the s...