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US Patent Issued on April 14 for "Socketed probes" (Texas Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,758, issued on April 14. "Socketed probes" was invented by Raul Molina (Austin, Texas). According to the abstract* released by the U.S. P... और पढ़ें


US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Cantilever probe card device and light scattering probe" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,759, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Cantilever probe card device and ... और पढ़ें


US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Probe card device and tunnel-type probe thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,760, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Probe card device and tunnel-type... और पढ़ें


US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Vertical probe card and open-type probe thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,761, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Vertical probe card and open-type... और पढ़ें


US Patent Issued to F Time Technology Industrial on April 14 for "Test terminal" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,762, issued on April 14, was assigned to F Time Technology Industrial Co. Ltd. (New Taipei City, Taiwan). "Test terminal" was invented by ... और पढ़ें


US Patent Issued to Schweitzer Engineering Laboratories on April 14 for "Current sensor with adjacent conductor rejection" (Idaho, Washington Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,763, issued on April 14, was assigned to Schweitzer Engineering Laboratories Inc. (Pullman, Wash.). "Current sensor with adjacent conducto... और पढ़ें


US Patent Issued to Bender on April 14 for "Electric circuit arrangement and method for the galvanically separate, AC/DC-sensitive residual-current measurement" (German Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,764, issued on April 14, was assigned to Bender GmbH & Co. KG (Gruenberg, Germany). "Electric circuit arrangement and method for the galva... और पढ़ें


US Patent Issued to Suncall on April 14 for "Current sensor" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,765, issued on April 14, was assigned to Suncall Corp. (Kyoto, Japan). "Current sensor" was invented by Akio Mugishima (Kyoto, Japan) and ... और पढ़ें


US Patent Issued to Tomaz Slivnik on April 14 for "Apparatus for measure of quantity and associated method of manufacturing" (British Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,766, issued on April 14, was assigned to Tomaz Slivnik (Sark, Great Britain). "Apparatus for measure of quantity and associated method of ... और पढ़ें


US Patent Issued to WILL SEMICONDUCTOR (SHANGHAI) on April 14 for "Current sense amplifier" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,767, issued on April 14, was assigned to WILL SEMICONDUCTOR (SHANGHAI) Co. LTD. (Shanghai). "Current sense amplifier" was invented by Hiro... और पढ़ें