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US Patent Issued to TEXAS INSTRUMENTS on Aug. 18 for "Opto-emulator" (Indian Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,454, issued on Aug. 18, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Opto-emulator" was invented by Kashyap Barot (Bengaluru, India), ... Read More


US Patent Issued to MediaTek on Aug. 18 for "Process-voltage sensor with smaller chip area" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,455, issued on Aug. 18, was assigned to MediaTek Inc. (Hsinchu City, Taiwan). "Process-voltage sensor with smaller chip area" was invented ... Read More


US Patent Issued to HITACHI ENERGY on Aug. 18 for "Device and method for measuring leakage current" (Swedish Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,456, issued on Aug. 18, was assigned to HITACHI ENERGY LTD (Zurich, Switzerland). "Device and method for measuring leakage current" was inv... Read More


US Patent Issued to Siemens on Aug. 18 for "State estimation of a power network" (German Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,457, issued on Aug. 18, was assigned to Siemens AG (Munich). "State estimation of a power network" was invented by Sascha Batz (Hemhofen, G... Read More


US Patent Issued to ELECTDIS on Aug. 18 for "Method for power calibration" (Swedish Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,458, issued on Aug. 18, was assigned to ELECTDIS AB (Malmo, Sweden). "Method for power calibration" was invented by Laurens Swaans (Malmo, ... Read More


US Patent Issued to SEMES on Aug. 18 for "Inspecting apparatus and semiconductor manufacturing equipment including the same" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,459, issued on Aug. 18, was assigned to SEMES Co. LTD. (Chungcheongnam-do, South Korea). "Inspecting apparatus and semiconductor manufactur... Read More


US Patent Issued to KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE on Aug. 18 for "Electromagnetically induced grating-based electric field detection system and method" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,460, issued on Aug. 18, was assigned to KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE (Daejeon, South Korea). "Electromagnetically indu... Read More


US Patent Issued to Digital Global Systems on Aug. 18 for "Systems, methods, and devices for automatic signal detection based on power distribution by frequency over time within a spectrum" (Maryland, Missouri Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,461, issued on Aug. 18, was assigned to Digital Global Systems Inc. (Tysons Corner, Va.). "Systems, methods, and devices for automatic sign... Read More


US Patent Issued to OTOWA ELECTRIC on Aug. 18 for "Sensor device capable of measuring electric field strength of an external electric field and method for measuring external electric field" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,462, issued on Aug. 18, was assigned to OTOWA ELECTRIC Co. LTD. (Osaka, Japan). "Sensor device capable of measuring electric field strength... Read More


US Patent Issued to Teradyne on Aug. 18 for "Analyzing bundles of wires" (Massachusetts Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,463, issued on Aug. 18, was assigned to Teradyne Inc. (North Reading, Mass.). "Analyzing bundles of wires" was invented by Tushar Gohel (Wi... Read More