ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,929, issued on Aug. 25, was assigned to NEC Corp. (Tokyo). "Dynamic line rating (DLR) of overhead transmission lines" was invented by Yangm... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,930, issued on Aug. 25, was assigned to DX TECH PTY LTD (Prahran, Australia). "Methods and systems for detection, location and characteriza... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,931, issued on Aug. 25, was assigned to Delta Electronics (Shanghai) Co. Ltd. (Shanghai). "Insulation detection method and apparatus for co... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,932, issued on Aug. 25, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Electronic circuit simulation based... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,933, issued on Aug. 25, was assigned to CHINA ACADEMY OF SPACE TECHNOLOGY (Beijing). "Method for testing total dose effect of SiC MOSFET de... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,934, issued on Aug. 25, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Electroluminescence inspection apparatus wit... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,935, issued on Aug. 25, was assigned to ROHDE & SCHWARZ GMBH & Co. KG (Munich). "Test and/or measurement device with noise figure functiona... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,936, issued on Aug. 25, was assigned to Wago Verwaltungsgesellschaft mbH (Minden, Germany). "Circuit with switch for discharging capacitive... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,937, issued on Aug. 25, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.). "Systems and methods for measuring waveforms at de... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,938, issued on Aug. 25, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Test device and semiconductor manufacturi... Read More