ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,862, issued on Sept. 15, was assigned to Viz.ai Inc. (San Francisco). "Method and system for computer-aided aneurysm triage" was invented ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,863, issued on Sept. 15, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea). "Electronic device and method of measuring b... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,864, issued on Sept. 15, was assigned to CANON K.K. (Tokyo). "Inspection system" was invented by Takeyuki Suda (Chiba, Japan). According ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,865, issued on Sept. 15, was assigned to RESONAC Corp. (Tokyo). "Program, condition search apparatus, and condition search method" was inv... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,866, issued on Sept. 15, was assigned to NEC Corp. (Tokyo). "Road deterioration diagnosing device, road deterioration diagnosing method, a... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,867, issued on Sept. 15, was assigned to FEI COMPANY (Hillsboro, Ore.). "Few-shot learning for processing microscopy images" was invented ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,868, issued on Sept. 15, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Defect detection method, device an... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,869, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor yield prediction method and ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,870, issued on Sept. 15, was assigned to CHINA PETROLEUM & CHEMICAL Corp. (Beijing) and SINOPEC RESEARCH INSTITUTE OF SAFETY ENGINEERING Co... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,871, issued on Sept. 15, was assigned to MAKEBLOCK HONGKONG HOLDING Ltd. (Hongkong, China). "Edge detection for computer numerically contr... Read More