US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Sept. 15 for "Defect detection method, device and system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,868, issued on Sept. 15, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Defect detection method, device and system" was invented by Maolong Niu (Ningde, China), Qiangwei Huang (Ningde, China), Jintan Xie (Ningde, China) and Yongfa Liu (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection method includes: obtaining an average grayscale value of an image; constructing a mapping table, where elements of the mapping table include a mapped value corresponding to each grayscale value within a grayscale value range of the image, a mapped value corresponding to a grayscale value greater than or equ...