Exclusive

Publication

Byline

Location

US Patent Issued to Duke University on Sept. 8 for "Systems and methods for photoacoustic microscopy" (North Carolina Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,060, issued on Sept. 8, was assigned to Duke University (Durham, N.C.). "Systems and methods for photoacoustic microscopy" was invented by ... Read More


US Patent Issued to Sensirion Connected Solutions on Sept. 8 for "Vibration damped sensor device" (Swiss Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,061, issued on Sept. 8, was assigned to Sensirion Connected Solutions AG (Stafa, Switzerland). "Vibration damped sensor device" was invente... Read More


US Patent Issued to TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL on Sept. 8 for "Polarizer and analyzer configuration optimization method and polarizing and analyzing system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,062, issued on Sept. 8, was assigned to TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL (Shenzhen, China). "Polarizer and analyzer configur... Read More


US Patent Issued to H2Ok Innovations on Sept. 8 for "Methods and systems for monitoring fluids" (California, Florida, Massachusetts Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,063, issued on Sept. 8, was assigned to H2Ok Innovations Inc. (Somerville, Mass.). "Methods and systems for monitoring fluids" was invented... Read More


US Patent Issued to Infineon Technologies on Sept. 8 for "Package for an optical radiation device" (British, German Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,064, issued on Sept. 8, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Package for an optical radiation device" was invent... Read More


US Patent Issued to Hitachi High-Tech on Sept. 8 for "Defect inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,065, issued on Sept. 8, was assigned to Hitachi High-Tech Corp. (Tokyo). "Defect inspection device" was invented by Takeru Utsugi (Tokyo), ... Read More


US Patent Issued to LEICA MICROSYSTEMS NC on Sept. 8 for "Method for three-dimensional (3D) image calibration for a spectral domain optical coherence tomography (OCT) system" (North Carolina Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,066, issued on Sept. 8, was assigned to LEICA MICROSYSTEMS NC INC. (Durham, N.C.). "Method for three-dimensional (3D) image calibration for... Read More


US Patent Issued to BDCM A2 on Sept. 8 for "Optically transparent and quasi-transparent reflectarrays for 5g applications" (California Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,067, issued on Sept. 8, was assigned to BDCM A2 LLC (Dover, Del.). "Optically transparent and quasi-transparent reflectarrays for 5g applic... Read More


US Patent Issued to California Institute of Technology on Sept. 8 for "Distributed time resolved fluorescence sensor using temporally correlated photons" (California Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,068, issued on Sept. 8, was assigned to California Institute of Technology (Pasadena, Calif.). "Distributed time resolved fluorescence sens... Read More


US Patent Issued to Genesis Intelligence on Sept. 8 for "Cartridge-based automated rapid test analyzer" (District Of Columbia Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,069, issued on Sept. 8, was assigned to Genesis Intelligence LLC (Jacksonville, Fla.). "Cartridge-based automated rapid test analyzer" was ... Read More