US Patent Issued to Max-Planck-Gesellschaft zur Forderung der Wissenschaften on Aug. 25 for "Method for mapping the surface of a macromolecule" (German Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,829, issued on Aug. 25, was assigned to Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V. (Berlin). "Method for mapping the sur... Read More

US Patent Issued to PBT Works s.r.o. on Aug. 25 for "Equipment for measuring the content of organic substances in water emulsions and solutions" (Czech Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,830, issued on Aug. 25, was assigned to PBT Works s.r.o. (Roznov pod Radhostem, Czech Republic). "Equipment for measuring the content of or... Read More

US Patent Issued to Sony Semiconductor Solutions on Aug. 25 for "Photodetection device and electronic device" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,831, issued on Aug. 25, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Photodetection device and electronic device"... Read More

US Patent Issued to SAMSUNG ELECTRONICS on Aug. 25 for "Non-destructive inspection method including inspecting multiple observation sites and method of manufacturing semiconductor memory device using the same" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,832, issued on Aug. 25, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Non-destructive inspection method including ... Read More

US Patent Issued to Applied Materials on Aug. 25 for "Optimized mirror-based light focusing for optical sensor assembly" (American, Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,834, issued on Aug. 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Optimized mirror-based light focusing for optical se... Read More

US Patent Issued to Chevron U.S.A. on Aug. 25 for "Spectroscopic analysis of rocks" (British, American Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,835, issued on Aug. 25, was assigned to Chevron U.S.A. Inc. (San Ramon, Calif.). "Spectroscopic analysis of rocks" was invented by Kenneth ... Read More

US Patent Issued to KLA on Aug. 25 for "Scanning diffraction based overlay scatterometry" (Israeli Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,837, issued on Aug. 25, was assigned to KLA Corp. (Milpitas, Calif.). "Scanning diffraction based overlay scatterometry" was invented by It... Read More

US Patent Issued to AMS-OSRAM INTERNATIONAL on Aug. 25 for "Optoelectronic device and a method for determining the distribution of a substance in a sample" (German Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,838, issued on Aug. 25, was assigned to AMS-OSRAM INTERNATIONAL GMBH (Regensburg, Germany). "Optoelectronic device and a method for determi... Read More

US Patent Issued to Tokyo Electron on Aug. 25 for "Measurement method and substrate processing apparatus" (New York Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,840, issued on Aug. 25, was assigned to Tokyo Electron Ltd. (Tokyo). "Measurement method and substrate processing apparatus" was invented b... Read More

US Patent Issued to Maruzen Petrochemical on Aug. 25 for "Method for evaluating resist polymer" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,841, issued on Aug. 25, was assigned to Maruzen Petrochemical Co. LTD. (Tokyo). "Method for evaluating resist polymer" was invented by Dais... Read More

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