ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,780, issued on Oct. 20, was assigned to KOKUSAI ELECTRIC Corp. (Tokyo). "Processing apparatus, recording medium, substrate processing metho... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,781, issued on Oct. 20, was assigned to Lam Research Corp. (Fremont, Calif.). "Apparatuses for measuring gap between a substrate support pl... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,782, issued on Oct. 20, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Substrate processing apparatus and substrate... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,783, issued on Oct. 20, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Load port module and driving method thereof"... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,784, issued on Oct. 20, was assigned to NANOVERSE TECHNOLOGIES LTD (Beaverton, Ore.). "Method of semiconductor fabrication" was invented by... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,785, issued on Oct. 20, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Measuring system and method of ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,786, issued on Oct. 20, was assigned to SEMES Co. LTD. (Chungcheongnam-do, South Korea). "Substrate transfer unit and substrate treatment a... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,787, issued on Oct. 20, was assigned to ASM IP Holding B.V. (Almere, Netherlands). "System for processing semiconductor wafer storage casse... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,039, issued on Oct. 20, was assigned to INTERNATIONAL BUSINESS MACHINES Corp. (Armonk, N.Y.). "Neural network architecture for concurrent l... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,040, issued on Oct. 20, was assigned to The Nielsen Co. (US) LLC (New York). "Methods and apparatus for determining whether media presentat... Read More