ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,069, issued on Aug. 4, was assigned to EYGS LLP (London). "Methods and apparatus for end-to-end unsupervised multi-document blind image deno... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,071, issued on Aug. 4, was assigned to Acer Inc. (New Taipei City, Taiwan). "Image sensing device and high dynamic range image generation me... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,072, issued on Aug. 4, was assigned to Koninklijke Philips N.V. (Eindhoven, Netherlands). "Optimizing the displaying of HDR images" was inve... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,073, issued on Aug. 4, was assigned to Intel Corp. (Santa Clara, Calif.). "Local adaptive contrast enhancement techniques" was invented by S... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,074, issued on Aug. 4, was assigned to aiMotive Kft. (Budapest, Hungary). "Method, data processing system, computer program product and comp... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,075, issued on Aug. 4, was assigned to BOE Technology Group Co. Ltd. (Beijing). "Image quality evaluation method and apparatus, device and s... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,076, issued on Aug. 4, was assigned to UBTECH ROBOTICS CORP LTD (Shenzhen, China). "Image quality assessment method, and electronic device a... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,077, issued on Aug. 4, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "Labeler scoring" was invented by James Michael Skinner (Arvada, ... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,078, issued on Aug. 4, was assigned to Yokogawa Electric Corp. (Tokyo). "Anomaly detection for component using pose-dependent machine learni... Read More
ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,079, issued on Aug. 4, was assigned to Nanjing University of Aeronautics and Astronautics (Nanjing City, China). "Cross-scale defect detecti... Read More