US Patent Issued to Nanjing University of Aeronautics and Astronautics on Aug. 4 for "Cross-scale defect detection method based on deep learning" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,079, issued on Aug. 4, was assigned to Nanjing University of Aeronautics and Astronautics (Nanjing City, China).

"Cross-scale defect detection method based on deep learning" was invented by Jun Wang (Nanjing, China), Zhongde Shan (Nanjing, China), Li Dai (Nanjing, China) and Dawei Li (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A cross-scale defect detection method based on deep learning, including: (S1) building a vision data acquisition system to acquire a surface image of a part to be processed; and building a defect dataset; (S2) building a deep learning-based cross-scale defect detection model; and inputting the defect dataset ...