ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,637, issued on June 23, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Method and apparatus for analyzing an image of a microl... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,638, issued on June 23, was assigned to NEC Corp. (Tokyo). "State determination apparatus, state determination method, and computer-readabl... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,639, issued on June 23, was assigned to FUJIFILM Business Innovation Corp. (Tokyo). "Information processing apparatus, non-transitory compu... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,640, issued on June 23, was assigned to RICOH COMPANY LTD. (Tokyo). "Inspection production control mechanism" was invented by Scott R. John... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,641, issued on June 23, was assigned to KLA Corp. (Milpitas, Calif.). "Interface-based defect inspection using second harmonic generation" ... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,642, issued on June 23, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Appearance detection method and appa... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,643, issued on June 23, was assigned to Evident Corp. (Nagano, Japan). "Inspection state notification method, inspection state notification... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,644, issued on June 23, was assigned to Paige.AI Inc. (New York). "Systems and methods for processing electronic images to visualize combin... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,645, issued on June 23, was assigned to CANON K.K. (Tokyo). "Cell image analysis method for detecting colony change points and non-transito... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,646, issued on June 23, was assigned to Nant Holdings IP LLC (El Segundo, Calif.). "Image-based circular plot recognition and interpretatio... Read More