ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,896, issued on July 21, was assigned to INTEL NDTM US LLC (Santa Clara, Calif.). "Deck reset read" was invented by Chao Zhang (Milpitas, Ca... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,897, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho). "Known-failure error handling in a memory sub-system" was in... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,898, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Method of operating nonvolatile memory devic... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,899, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Device providing improved fail bit count ope... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,900, issued on July 21, was assigned to ASPINITY INC. (Pittsburgh). "Compute-in-memory array multi-range temperature compensation" was inve... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,901, issued on July 21, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Semiconductor device that detects connection defects betwe... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,902, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho). "Scheduling scan operations in memory sub-systems" was inven... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,903, issued on July 21, was assigned to Renesas Electronics Corp. (Tokyo). "Semiconductor device and testing method for memory circuit" was... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,904, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho). "Adaptive error avoidance in the memory devices" was invente... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,905, issued on July 21, was assigned to GRAIL LLC (Menlo Park, Calif.). "Method and system of cancer detection using CpG-SNP contamination ... Read More