US Patent Issued to SAMSUNG ELECTRONICS on July 21 for "Device providing improved fail bit count operation" (South Korean Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,899, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Device providing improved fail bit count operation" was invented by Eunchan Lee (Suwon-si, South Korea), Jungyu Lee (Suwon-si, South Korea), Yumin Kim (Suwon-si, South Korea), Jihyun Park (Suwon-si, South Korea) and Jayang Yoon (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device includes a first current mirror circuit including a plurality of first transistors, the plurality of first transistors including a common gate configured to receive a decoding signal according to a number of fail bits that are program-failed, a second cur...