ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,915, issued on Aug. 11, was assigned to Semes Co. Ltd. (Chungcheongnam-do, South Korea). "Apparatus for treating substrate" was invented by... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,916, issued on Aug. 11, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Brush assembly and wafer cleaning device inc... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,917, issued on Aug. 11, was assigned to SCREEN Holdings Co. Ltd. (Kyoto, Japan). "Substrate processing method and substrate processing devi... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,918, issued on Aug. 11, was assigned to KOKUSAI ELECTRIC Corp. (Tokyo). "Substrate processing apparatus, method of manufacturing semiconduc... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,919, issued on Aug. 11, was assigned to Tokyo Electron Ltd. (Tokyo). "Bonding apparatus and bonding method" was invented by Tokutarou Hayas... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,920, issued on Aug. 11, was assigned to SCREEN Holdings Co. Ltd. (Japan). "Processing condition specifying method, substrate processing met... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,921, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Methods and assemblies for gas flow ratio control" w... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,922, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Determining a substrate location threshold based on ... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,923, issued on Aug. 11, was assigned to EBARA Corp. (Tokyo). "Substrate conveyance method, substrate processing device, and recording mediu... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,924, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Systems and methods for detecting a substrate in a c... Read More