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US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Probe card device and tunnel-type probe thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,760, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Probe card device and tunnel-type... Read More


US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Vertical probe card and open-type probe thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,761, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Vertical probe card and open-type... Read More


US Patent Issued to F Time Technology Industrial on April 14 for "Test terminal" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,762, issued on April 14, was assigned to F Time Technology Industrial Co. Ltd. (New Taipei City, Taiwan). "Test terminal" was invented by ... Read More


US Patent Issued to Schweitzer Engineering Laboratories on April 14 for "Current sensor with adjacent conductor rejection" (Idaho, Washington Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,763, issued on April 14, was assigned to Schweitzer Engineering Laboratories Inc. (Pullman, Wash.). "Current sensor with adjacent conducto... Read More


US Patent Issued to Bender on April 14 for "Electric circuit arrangement and method for the galvanically separate, AC/DC-sensitive residual-current measurement" (German Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,764, issued on April 14, was assigned to Bender GmbH & Co. KG (Gruenberg, Germany). "Electric circuit arrangement and method for the galva... Read More


US Patent Issued to Suncall on April 14 for "Current sensor" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,765, issued on April 14, was assigned to Suncall Corp. (Kyoto, Japan). "Current sensor" was invented by Akio Mugishima (Kyoto, Japan) and ... Read More


US Patent Issued to Tomaz Slivnik on April 14 for "Apparatus for measure of quantity and associated method of manufacturing" (British Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,766, issued on April 14, was assigned to Tomaz Slivnik (Sark, Great Britain). "Apparatus for measure of quantity and associated method of ... Read More


US Patent Issued to WILL SEMICONDUCTOR (SHANGHAI) on April 14 for "Current sense amplifier" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,767, issued on April 14, was assigned to WILL SEMICONDUCTOR (SHANGHAI) Co. LTD. (Shanghai). "Current sense amplifier" was invented by Hiro... Read More


US Patent Issued to Truma Geraetetechnik on April 14 for "Monitoring assembly and system having a monitoring assembly" (German Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,768, issued on April 14, was assigned to Truma Geraetetechnik GmbH & Co. KG (Putzbrunn, Germany). "Monitoring assembly and system having a... Read More


US Patent Issued to HAMILTON SUNDSTRAND on April 14 for "Input isolated voltage monitor" (Indian Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,769, issued on April 14, was assigned to HAMILTON SUNDSTRAND Corp. (Charlotte, N.C.). "Input isolated voltage monitor" was invented by Nag... Read More