US Patent Issued to CXMT on Nov. 3 for "Memory" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,857, issued on Nov. 3, was assigned to CXMT Corp. (Hefei City, China). "Memory" was invented by Weibing Shang (Hefei City, China), Xiangyun ... Read More

US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING, NATIONAL TSING HUA UNIVERSITY on Nov. 3 for "System, memory device and method" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,858, issued on Nov. 3, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan) and NATIONAL TSING HUA UNIVERSITY (H... Read More

US Patent Issued on Nov. 3 for "Dynamic row address mapping for mitigating row hammer effect in DRAM" (Iowa Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,859, issued on Nov. 3. "Dynamic row address mapping for mitigating row hammer effect in DRAM" was invented by James Maxted (Cedar Rapids, Io... Read More

US Patent Issued on Nov. 3 for "One-time programmable memory device and semiconductor memory device including the same" (South Korean Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,860, issued on Nov. 3. "One-time programmable memory device and semiconductor memory device including the same" was invented by Yeongmuk Cho... Read More

US Patent Issued to SK hynix on Nov. 3 for "Semiconductor apparatus having test function and semiconductor system including the same" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,861, issued on Nov. 3, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Semiconductor apparatus having test function and semiconduct... Read More

US Patent Issued to SAMSUNG ELECTRONICS on Nov. 3 for "Memory device including reference resistance" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,862, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Memory device including reference resistance" ... Read More

US Patent Issued to Kioxia on Nov. 3 for "Test apparatus and test method" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,863, issued on Nov. 3, was assigned to Kioxia Corp. (Tokyo). "Test apparatus and test method" was invented by Michiru Hogyoku (Yokohama, Jap... Read More

US Patent Issued to Rambus on Nov. 3 for "Timing-drift calibration" (California, Vermont Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,864, issued on Nov. 3, was assigned to Rambus Inc. (San Jose, Calif.). "Timing-drift calibration" was invented by Yohan U. Frans (Palo Alto,... Read More

US Patent Issued to Advanced Micro Devices on Nov. 3 for "Apparatuses, systems, and methods for signal redundancy in stacked-chip architectures" (Texas Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,865, issued on Nov. 3, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.). "Apparatuses, systems, and methods for signal redu... Read More

US Patent Issued to Samsung SDI on Nov. 3 for "Apparatus and method for diagnosing memory" (South Korean Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,866, issued on Nov. 3, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea). "Apparatus and method for diagnosing memory" was inven... Read More

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