US Patent Issued to Kioxia on Nov. 3 for "Test apparatus and test method" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,863, issued on Nov. 3, was assigned to Kioxia Corp. (Tokyo).

"Test apparatus and test method" was invented by Michiru Hogyoku (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a test apparatus, a controller obtains a threshold voltage of a memory cell by performing first processing on a read characteristic. The first processing is processing of, when a subthreshold region in the read characteristic is defined as a first region, focusing on a second region being a region of a read voltage larger than a maximum read voltage of the first region. The controller calculates a first slope in a first threshold characteristic indicating a rel...