US Patent Issued to Cirrus Logic on Oct. 27 for "Circuitry for measurement of electrochemical cells" (British Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,983, issued on Oct. 27, was assigned to Cirrus Logic Inc. (Austin, Texas). "Circuitry for measurement of electrochemical cells" was invente... Read More

US Patent Issued to ProteinSimple on Oct. 27 for "Apparatus, systems, and methods for capillary electrophoresis" (California Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,984, issued on Oct. 27, was assigned to ProteinSimple (San Jose, Calif.). "Apparatus, systems, and methods for capillary electrophoresis" w... Read More

US Patent Issued to Leidos Security Detection & Automation on Oct. 27 for "Chemical trace detection system" (Massachusetts, New Hampshire Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,985, issued on Oct. 27, was assigned to Leidos Security Detection & Automation Inc. (Tewksbury, Mass.). "Chemical trace detection system" w... Read More

US Patent Issued to The Boeing on Oct. 27 for "Systems, methods, and apparatus for determining AC losses in superconductors" (Virginia Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,986, issued on Oct. 27, was assigned to The Boeing Co. (Arlington, Va.). "Systems, methods, and apparatus for determining AC losses in supe... Read More

US Patent Issued to SUMCO on Oct. 27 for "Method of estimating oxygen concentration in silicon single crystal, method of manufacturing silicon single crystal, and silicon single crystal manufacturing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,987, issued on Oct. 27, was assigned to SUMCO Corp. (Tokyo). "Method of estimating oxygen concentration in silicon single crystal, method o... Read More

US Patent Issued to JFE STEEL on Oct. 27 for "Mechanical property measuring apparatus, mechanical property measuring method, substance manufacturing equipment, substance management method, and substance manufacturing method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,988, issued on Oct. 27, was assigned to JFE STEEL Corp. (Tokyo). "Mechanical property measuring apparatus, mechanical property measuring me... Read More

US Patent Issued to Renishaw on Oct. 27 for "Ultrasound inspection probe and corresponding inspection method" (British Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,989, issued on Oct. 27, was assigned to Renishaw PLC (Wotton-under-Edge, Great Britain). "Ultrasound inspection probe and corresponding ins... Read More

US Patent Issued to Arizona Board of Regents on behalf of Arizona State University on Oct. 27 for "Systems and methods for detection of micron-scale inhomogeneities using ultrasound" (Arizona Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,990, issued on Oct. 27, was assigned to Arizona Board of Regents on behalf of Arizona State University (Scottsdale, Ariz.). "Systems and me... Read More

US Patent Issued to DELTA ELECTRONICS on Oct. 27 for "Material recognition system and method" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,992, issued on Oct. 27, was assigned to DELTA ELECTRONICS INC. (Taoyuan City, Taiwan). "Material recognition system and method" was invente... Read More

US Patent Issued to THERMO FINNIGAN on Oct. 27 for "Method of utilizing deuterium gas for chromatography applications, deuterium gas generator and devices for conservation thereof" (Texas Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,993, issued on Oct. 27, was assigned to THERMO FINNIGAN LLC (San Jose, Calif.). "Method of utilizing deuterium gas for chromatography appli... Read More

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