US Patent Issued to Tokyo Electron on Oct. 20 for "Testing apparatus and testing method" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,799, issued on Oct. 20, was assigned to Tokyo Electron Ltd. (Tokyo). "Testing apparatus and testing method" was invented by Hiroyuki Nakaya... Read More

US Patent Issued to FURUNO ELECTRIC on Oct. 20 for "Learning system of precipitable water vapor estimation model, precipitable water vapor estimation system, method, and computer-readable recording medium" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,800, issued on Oct. 20, was assigned to FURUNO ELECTRIC Co. LTD. (Hyogo, Japan). "Learning system of precipitable water vapor estimation mo... Read More

US Patent Issued to National Technology & Engineering Solutions of Sandia on Oct. 20 for "Path-integrated x-ray images for digital image correlation" (New Mexico, California, Illinois Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,801, issued on Oct. 20, was assigned to National Technology & Engineering Solutions of Sandia LLC (Albuquerque, N.M.). "Path-integrated x-r... Read More

US Patent Issued to UNITED IMAGING HEALTHCARE NORTH AMERICA on Oct. 20 for "Emission computed tomography detector assemblies and methods thereof" (Texas Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,802, issued on Oct. 20, was assigned to UNITED IMAGING HEALTHCARE NORTH AMERICA INC. (Houston). "Emission computed tomography detector asse... Read More

US Patent Issued to NUCTECH on Oct. 20 for "Conveying system for inspection device" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,803, issued on Oct. 20, was assigned to NUCTECH COMPANY Ltd. (Beijing). "Conveying system for inspection device" was invented by Qingping H... Read More

US Patent Issued to Carl Zeiss SMT on Oct. 20 for "Method of 3D volume inspection of semiconductor wafers with increased throughput" (German, American Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,804, issued on Oct. 20, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Method of 3D volume inspection of semiconductor wafers ... Read More

US Patent Issued on Oct. 20 for "Process and device for the spatially resolved localization of defects in materials" (German Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,805, issued on Oct. 20. "Process and device for the spatially resolved localization of defects in materials" was invented by Sri Ranjini Ar... Read More

US Patent Issued to Infineon Technologies on Oct. 20 for "Enhanced offset compensation technique for thermal conductivity sensing of a gas concentration sensor" (Romanian Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,806, issued on Oct. 20, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Enhanced offset compensation technique for thermal ... Read More

US Patent Issued to HORIBA Advanced Techno on Oct. 20 for "Ionic-liquid-containing polymer" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,807, issued on Oct. 20, was assigned to HORIBA Advanced Techno Co. Ltd. (Kyoto, Japan). "Ionic-liquid-containing polymer" was invented by Y... Read More

US Patent Issued to Micro Tech Medical (Hangzhou) on Oct. 20 for "Glucose electrochemical sensor and preparation method thereof" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,808, issued on Oct. 20, was assigned to Micro Tech Medical (Hangzhou) Co. Ltd. (Hangzhou, China). "Glucose electrochemical sensor and prepa... Read More

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