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US Patent Issued to Applied Materials on July 14 for "Dynamic ion beam shape selection" (Massachusetts Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,111, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Dynamic ion beam shape selection" was invented by Ri... Read More


US Patent Issued to Taiwan Semiconductor Manufacturing on July 14 for "Ion generators of ion implanters with movable repeller" (Taiwanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,112, issued on July 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Ion generators of ion implanters wi... Read More


US Patent Issued to National University of Singapore on July 14 for "Ion microscope" (Singaporean Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,113, issued on July 14, was assigned to National University of Singapore (Singapore). "Ion microscope" was invented by Jeroen Anton Van Kan... Read More


US Patent Issued to TOHOKU UNIVERSITY on July 14 for "Electron beam modulation device and electron beam modulation method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,114, issued on July 14, was assigned to TOHOKU UNIVERSITY (Sendai, Japan). "Electron beam modulation device and electron beam modulation me... Read More


US Patent Issued to FEI on July 14 for "Methods and systems for tomographic microscopy imaging" (Dutch, Norwegian, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,116, issued on July 14, was assigned to FEI Co. (Hillsboro, Ore.). "Methods and systems for tomographic microscopy imaging" was invented by... Read More


US Patent Issued to Carl Zeiss MultiSEM on July 14 for "Multiple particle beam system with a mirror mode of operation, method for operating a multiple particle beam system with a mirror mode of operation and associated computer program product" (German Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,117, issued on July 14, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany). "Multiple particle beam system with a mirror mode o... Read More


US Patent Issued to Infineon Technologies on July 14 for "Scanning electron microscopy-based sample analysis" (Austrian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,118, issued on July 14, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Scanning electron microscopy-based sample analysis"... Read More


US Patent Issued to Hitachi High-Tech Science on July 14 for "Computer, program, and charged particle beam processing system" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,119, issued on July 14, was assigned to Hitachi High-Tech Science Corp. (Tokyo). "Computer, program, and charged particle beam processing s... Read More


US Patent Issued to Tokyo Electron on July 14 for "Substrate processing method and substrate processing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,120, issued on July 14, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate processing method and substrate processing apparatus" was i... Read More


US Patent Issued to Applied Materials on July 14 for "Pulsed voltage plasma processing apparatus and method" (California Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,121, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Pulsed voltage plasma processing apparatus and metho... Read More