GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075116) for "METHODS FOR BIT RATE CONTROL FOR EXTENDED REALITY (XR)" on Sep 04, 2025. With pub... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075117) for "SELECTION OF SYSTEM INFORMATION BLOCK TRANSMISSION MODE" on Sep 04, 2025. With pu... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075119) for "ADAPTATION OF SSB TRANSMISSION BEFORE PAGING" on Sep 04, 2025. With publication n... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075131) for "SELECTION OF SYSTEM INFORMATION BLOCK TRANSMISSION MODE" on Sep 04, 2025. With pu... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075133) for "SELECTION OF SYSTEM INFORMATION BLOCK TRANSMISSION MODE" on Sep 04, 2025. With pu... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075134) for "METHOD FOR BIT RATE CONTROL SUPPORT FOR XR" on Sep 04, 2025. With publication no.... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075167) for "MEASUREMENT EVENT PREDICTION BASED MOBILITY OPTIMIZATION" on Sep 04, 2025. With p... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075174) for "CELL SWITCH CONDITION EVALUATION" on Sep 04, 2025. With publication no. WO/2026/0... Read More
GENEVA, April 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/075185) for "MEASUREMENT EVENT PREDICTION BASED MOBILITY OPTIMIZATION" on Sep 04, 2025. With p... Read More
GENEVA, April 13 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2025/075245) for "METHODS AND SYSTEMS FOR DETERMINING RETICLE DEFORMATION" on Sep 04, 2025. ... Read More