ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,605, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (South Korea). "Systems, methods, and apparatus for image classificati... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,606, issued on July 14, was assigned to LandingAI Inc. (Palo Alto, Calif.). "Output accuracy refinement mechanism for visual prompting" was... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,607, issued on July 14, was assigned to NATIONAL TAIWAN UNIVERSITY (Taipei City, Taiwan). "Ultrasound image detection system and method the... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,608, issued on July 14, was assigned to TenD.AI Medical Technology (Shanghai) Co. Ltd. (Shanghai). "Method and system for classifying breas... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,609, issued on July 14, was assigned to NXP B.V. (Eindhoven, Netherlands). "Method for visualizing a classification prediction of a machine... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,610, issued on July 14, was assigned to Amazon Technologies Inc. (Seattle). "Multimedia content encoding" was invented by Harshavardhan Sun... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,611, issued on July 14, was assigned to Tencent Technology Co. Ltd. (Shenzhen, China). "Image acquisition model training method and apparat... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,612, issued on July 14, was assigned to ADOBE INC. (San Jose, Calif.). "Weak supervised training data for image tagging models" was invente... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,613, issued on July 14, was assigned to Tempus AI Inc. (Chicago). "Graph based metadata structuring algorithm to enable machine learning" w... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,614, issued on July 14, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Microscopy system and method for calculating a result ... और पढ़ें