US Patent Issued to Carl Zeiss Microscopy on July 14 for "Microscopy system and method for calculating a result image using an ordinal classification model" (German Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,614, issued on July 14, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Microscopy system and method for calculating a result image using an ordinal classification model" was invented by Manuel Amthor (Jena, Germany) and Daniel Haase (Zoellnitz, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microscopy system forms a result image from a microscope image using an ordinal classification model. The ordinal classification model comprises classifiers and is defined by a training designed as follows: predetermined microscope images are input into the ordinal classification model in the training; a target image is given for each pred...