ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,891, issued on Sept. 8, was assigned to Amazon Technologies Inc. (Seattle). "Hybrid scanning using deferral learning" was invented by Micha... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,892, issued on Sept. 8, was assigned to HITACHI LTD. (Tokyo). "Analysis evasion function detection system and analysis evasion function det... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,893, issued on Sept. 8, was assigned to Halcyon Tech Inc. (Austin, Texas). "Antiransomware using machine learning" was invented by Ryan Smi... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,895, issued on Sept. 8, was assigned to NXP B.V. (Eindhoven, Netherlands). "Apparatuses and methods for verification of updated data-set" w... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,896, issued on Sept. 8, was assigned to Rapid7 Inc. (Boston). "Refining a machine learning model for calculating confidence scores associat... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,897, issued on Sept. 8, was assigned to Acronis International GmbH (Schaffhausen, Switzerland). "Automation platform for pentest collaborat... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,898, issued on Sept. 8, was assigned to NXP B.V. (Eindhoven, Netherlands). "Testing of security systems in integrated circuits" was invente... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,899, issued on Sept. 8, was assigned to FORTINET INC. (Sunnyvale, Calif.). "Generating monitoring programs for detecting actions in softwar... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,900, issued on Sept. 8, was assigned to NEC Corp. (Tokyo). "System design device, system design method, and storage medium" was invented by... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,901, issued on Sept. 8, was assigned to PANASONIC AUTOMOTIVE SYSTEMS Co. LTD. (Kanagawa, Japan). "Assessment apparatus and assessment metho... Read More