US Patent Issued to NXP on Sept. 8 for "Testing of security systems in integrated circuits" (Indian Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,898, issued on Sept. 8, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Testing of security systems in integrated circuits" was invented by Neha Srivastava (New Delhi) and Gautam Tikoo (Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a secure asset, a security system, and an efficacy decoder. The security system is triggered to operate in one of its functional states. Further, the security system receives various test requests for an access to the secure asset, and determines, based on the triggered functional state thereof, one or more test requests authorized to access the secure asset. The efficacy d...