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US Patent Issued to Tohoku University on July 14 for "Method for calculating elastic modulus and device for calculating elastic modulus" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,967, issued on July 14, was assigned to Tohoku University (Sendai, Japan). "Method for calculating elastic modulus and device for calculati... Read More


US Patent Issued to KLA on July 14 for "Soft x-ray optics with improved filtering" (Texas, California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,968, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Soft x-ray optics with improved filtering" was invented by Alexander... Read More


US Patent Issued to The Regents of the University of California on July 14 for "Methods for collecting electron diffraction patterns" (California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,969, issued on July 14, was assigned to The Regents of the University of California (Oakland, Calif.). "Methods for collecting electron dif... Read More


US Patent Issued to KLA on July 14 for "Methods and systems for x-ray scatterometry measurements employing a machine learning based electromagnetic response model" (California, Michigan Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,970, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Methods and systems for x-ray scatterometry measurements employing a... Read More


US Patent Issued to SHIMADZU on July 14 for "Analysis system, analysis device, and control method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,971, issued on July 14, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Analysis system, analysis device, and control method" was invented ... Read More


US Patent Issued to SHIMADZU on July 14 for "X-ray fluorescence spectrometer and power supply apparatus" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,972, issued on July 14, was assigned to SHIMADZU Corp. (Kyoto, Japan). "X-ray fluorescence spectrometer and power supply apparatus" was inv... Read More


US Patent Issued to ABB Schweiz on July 14 for "Computer implemented method for providing temperature data, a computer product element and a system" (German, Indian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,974, issued on July 14, was assigned to ABB Schweiz AG (Baden, Switzerland). "Computer implemented method for providing temperature data, a... Read More


US Patent Issued to KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY on July 14 for "Small-sized, reconfigurable, multi-measurement potentiostat circuitry and method" (Saudi Arabia Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,975, issued on July 14, was assigned to KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY (Thuwal, Saudi Arabia). "Small-sized, reconfigur... Read More


US Patent Issued to CEBI ELECTROMECHANICAL COMPONENTS SPAIN on July 14 for "Device for measuring electrical conductivity in liquid media" (Spanish Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,976, issued on July 14, was assigned to CEBI ELECTROMECHANICAL COMPONENTS SPAIN S.A. (Villatuerta, Spain). "Device for measuring electrical... Read More


US Patent Issued to SHANGHAI TANON LIFE SCIENCE on July 14 for "Detachable electrode holder and electrophoresis device" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,977, issued on July 14, was assigned to SHANGHAI TANON LIFE SCIENCE Co. LTD (Shanghai). "Detachable electrode holder and electrophoresis de... Read More