ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,864, issued on Sept. 1, was assigned to SEIKO EPSON Corp. (Japan). "Balanced heterodyne laser interferometer with optical axis shift" was i... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,865, issued on Sept. 1, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea). "Optical self-heterod... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,866, issued on Sept. 1, was assigned to MICRO-EPSILON Optronic GmbH (Langebrueck, Germany). "Optical distance sensor with closed-loop expos... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,867, issued on Sept. 1, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Dimension detection apparatus and de... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,868, issued on Sept. 1, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea). "Molding thickness in... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,869, issued on Sept. 1, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea). "Clearance measuring apparatus" was invented by Heet... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,870, issued on Sept. 1. "Shape measurement device and shape measurement method" was invented by Yoshito Hashimura (Amagasaki-shi, Jamaica),... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,871, issued on Sept. 1, was assigned to RIBER (Bezons, France). "Instrument and method for measuring the curvature and reflectivity of a su... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,872, issued on Sept. 1, was assigned to Palladyne Corp. (Salt Lake City). "High resolution optical displacement measurement" was invented b... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,873, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Overlay measuring method and system, and ... Read More