US Patent Issued to RIBER on Sept. 1 for "Instrument and method for measuring the curvature and reflectivity of a surface of a sample" (French Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,871, issued on Sept. 1, was assigned to RIBER (Bezons, France).

"Instrument and method for measuring the curvature and reflectivity of a surface of a sample" was invented by Youri Rousseau (Maisons Laffite, France), Jean-Louis Guyaux (La Vernelle, France) and Alexandre Arnoult (Auzeville-Tolosane, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to an instrument for measuring the curvature of a surface of a sample (8), comprising a light source (1) and a mask (2), Ie light source (1) illuminating the mask (2) so as to generate a light beam (10) incident on the surface of the sample and to form a light beam (20) reflected b...