ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,470, issued on Sept. 15, was assigned to KXS TECHNOLOGIES OY (Espoo, Finland). "Optical process monitoring device" was invented by Harri S... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,471, issued on Sept. 15, was assigned to NAGANO KEIKI Co. LTD. (Tokyo). "Optical sensor and physical quantity measurement device having a ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,472, issued on Sept. 15, was assigned to JEDEX INC. (Yongin-si, South Korea). "Optical foreign substance detection device using light scat... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,473, issued on Sept. 15, was assigned to BOE Technology Group Co. Ltd. (Beijing). "Color diffraction test device and test method thereof, ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,474, issued on Sept. 15, was assigned to Korea Institute of Ocean Science & Technology (Busan, South Korea). "System and method for calcul... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,475, issued on Sept. 15, was assigned to NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (Tokyo). "Luminescent substrate ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,476, issued on Sept. 15, was assigned to SafetySpect Inc. (Sherman Oaks, Calif.). "System and method for assessing product" was invented b... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,477, issued on Sept. 15, was assigned to LIFE TECHNOLOGIES Corp. (Carlsbad, Calif.). "Optical systems and methods for biological analysis"... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,478, issued on Sept. 15, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea). "Laser inspection system and inspection meth... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,479, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measurement apparatus" was i... Read More