ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,479, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Semiconductor measurement apparatus" was invented by Donggun Lee (Suwon-si, South Korea), Jaewon Lee (Suwon-si, South Korea), Jinwoo Ahn (Suwon-si, South Korea), Juntaek Oh (Suwon-si, South Korea) and Eunsoo Hwang (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor measurement apparatus includes an illuminator configured to output light having a first wavelength band light having a second wavelength band, different from the first wavelength band, a stage on which a test object is positioned, a camera configured to receiv...