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US Patent Issued to DONGWOO FINE-CHEM on Sept. 15 for "Particle measurement device" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,459, issued on Sept. 15, was assigned to DONGWOO FINE-CHEM Co. LTD. (Jeollabuk-do, South Korea). "Particle measurement device" was invente... Read More


US Patent Issued to MAZDA MOTOR on Sept. 15 for "Corrosion resistance test method, corrosion resistance test apparatus, and corrosion resistance test program for coated metal material, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,460, issued on Sept. 15, was assigned to MAZDA MOTOR Corp. (Hiroshima, Japan). "Corrosion resistance test method, corrosion resistance tes... Read More


US Patent Issued to HORIBA Advanced Techno on Sept. 15 for "Measurement instrument, measurement device, measurement system, and measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,462, issued on Sept. 15, was assigned to HORIBA Advanced Techno Co. Ltd. (Kyoto, Japan). "Measurement instrument, measurement device, meas... Read More


US Patent Issued to Yangtze Delta Region Institute (Huzhou), University of Electronic Science and Technology of China on Sept. 15 for "Background reduction method for soil XRF spectrum based on XRF-EGAN model" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,463, issued on Sept. 15, was assigned to Yangtze Delta Region Institute (Huzhou), University of Electronic Science and Technology of China ... Read More


US Patent Issued to Semes on Sept. 15 for "Substrate measurement method and substrate measurement control apparatus" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,464, issued on Sept. 15, was assigned to Semes Co. Ltd. (Chungcheongnam-do, South Korea). "Substrate measurement method and substrate meas... Read More


US Patent Issued to SICK on Sept. 15 for "Spectroscopic analysis apparatus comprising a multi-chamber cuvette for fluid or gas analysis and corresponding method" (German Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,465, issued on Sept. 15, was assigned to SICK AG (Waldkirch, Germany). "Spectroscopic analysis apparatus comprising a multi-chamber cuvett... Read More


US Patent Issued to ANRITSU on Sept. 15 for "Spectroscopic measurement device and article inspection device including the same" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,466, issued on Sept. 15, was assigned to ANRITSU Corp. (Kanagawa, Japan). "Spectroscopic measurement device and article inspection device ... Read More


US Patent Issued to TAMRON on Sept. 15 for "Spectroscopic apparatus and gas detection apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,467, issued on Sept. 15, was assigned to TAMRON Co. LTD. (Saitama, Japan). "Spectroscopic apparatus and gas detection apparatus" was inven... Read More


US Patent Issued to Advanced ACEBIOTEK on Sept. 15 for "Layered detection method and layered detection system" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,468, issued on Sept. 15, was assigned to Advanced ACEBIOTEK Co. LTD. (Hsinchu County, Taiwan). "Layered detection method and layered detec... Read More


US Patent Issued to FUJIFILM on Sept. 15 for "Optical element and optical sensor" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,469, issued on Sept. 15, was assigned to FUJIFILM Corp. (Tokyo). "Optical element and optical sensor" was invented by Yukito Saitoh (Minam... Read More