Exclusive

Publication

Byline

Location

US Patent Issued to Abbott Laboratories on Oct. 27 for "Systems and methods for pooling samples for high-throughput analysis" (Illinois, Texas Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,018, issued on Oct. 27, was assigned to Abbott Laboratories (Abbott Park, Israel). "Systems and methods for pooling samples for high-throug... Read More


US Patent Issued to AUTOBIO LABTEC INSTRUMENTS on Oct. 27 for "Cartridge preprocessing system for use in automated molecular diagnostics instrument" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,019, issued on Oct. 27, was assigned to AUTOBIO LABTEC INSTRUMENTS Co. LTD. (Zhengzhou, China). "Cartridge preprocessing system for use in ... Read More


US Patent Issued to QINGDAO HAIER REFRIGERATOR, HAIER SMART HOME on Oct. 27 for "Microfluidic detection system, control method therefor, and refrigerator" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,020, issued on Oct. 27, was assigned to QINGDAO HAIER REFRIGERATOR Co. LTD. (Qingdao, China) and HAIER SMART HOME Co. LTD. (Qingdao, China).... Read More


US Patent Issued to Robert Bosch on Oct. 27 for "Plug and play wheel speed sensor" (Mexican Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,021, issued on Oct. 27, was assigned to Robert Bosch GmbH (Stuttgart, Germany). "Plug and play wheel speed sensor" was invented by Jesus Ro... Read More


US Patent Issued to NANO-X on Oct. 27 for "Probe-head for electrical device inspection and manufacturing method thereof" (South Korean Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,022, issued on Oct. 27, was assigned to NANO-X Co. LTD (Suwon-si, South Korea). "Probe-head for electrical device inspection and manufactur... Read More


US Patent Issued to Tokyo Electron on Oct. 27 for "Connection assembly and inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,023, issued on Oct. 27, was assigned to Tokyo Electron Ltd. (Tokyo). "Connection assembly and inspection device" was invented by Hidesumi M... Read More


US Patent Issued to Taiwan Semiconductor Manufacturing on Oct. 27 for "Testing system and testing method of using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,024, issued on Oct. 27, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Testing system and testing method o... Read More


US Patent Issued to Asahi Kasei Microdevices on Oct. 27 for "Current detection device" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,026, issued on Oct. 27, was assigned to Asahi Kasei Microdevices Corp. (Tokyo). "Current detection device" was invented by Takehiro Maruyam... Read More


US Patent Issued to EXAIL on Oct. 27 for "Optical fibre interferometer and method for measuring a magnetic field or an electrical current based on said interferometer by correcting for errors affecting scaling factor" (French Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,027, issued on Oct. 27, was assigned to EXAIL (Saint-Germain-en-Laye, France). "Optical fibre interferometer and method for measuring a mag... Read More


US Patent Issued to Infineon Technologies on Oct. 27 for "Current sense circuit and current sensing method that adjusts a start measurement value for successive measurement cycles" (Italian Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,028, issued on Oct. 27, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Current sense circuit and current sensing method th... Read More